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Company Information for

DEBEN UK LIMITED

52C BOROUGH HIGH STREET, LONDON, SE1 1XN,
Company Registration Number
03208255
Private Limited Company
Active

Company Overview

About Deben Uk Ltd
DEBEN UK LIMITED was founded on 1996-06-05 and has its registered office in London. The organisation's status is listed as "Active". Deben Uk Limited is a Private Limited Company registered in ENGLAND with Companies House and the accounts submission requirement is categorised as SMALL
Key Data
Company Name
DEBEN UK LIMITED
 
Legal Registered Office
52C BOROUGH HIGH STREET
LONDON
SE1 1XN
Other companies in RH19
 
Filing Information
Company Number 03208255
Company ID Number 03208255
Date formed 1996-06-05
Country ENGLAND
Origin Country United Kingdom
Type Private Limited Company
CompanyStatus Active
Lastest accounts 31/12/2022
Account next due 30/09/2024
Latest return 05/06/2016
Return next due 03/07/2017
Type of accounts SMALL
VAT Number /Sales tax ID GB676966757  
Last Datalog update: 2023-10-08 07:19:19
Primary Source:Companies House
There are multiple companies registered at this address, the registered address may be the accountant's offices for DEBEN UK LIMITED
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Company Officers of DEBEN UK LIMITED

Current Directors
Officer Role Date Appointed
CHRISTOPHER TALBOT
Company Secretary 2017-03-16
DAVID ELIE CICUREL
Director 2011-03-18
GARY PAUL EDWARDS
Director 1996-06-24
PAUL MICHAEL GADSBY
Director 2015-03-10
MARK STEPHEN LAVELLE
Director 2017-11-15
BRADLEY LEONARD ORMSBY
Director 2015-03-10
EDWARD JOHN WILLIAMSON-BROWN
Director 2015-06-03
Previous Officers
Officer Role Date Appointed Date Resigned
DAVID BARNBROOK
Director 2011-03-18 2017-12-31
NICHOLAS JAMS BARTHEE
Director 2015-03-10 2017-03-17
TRACEY EDWARDS
Company Secretary 1996-06-24 2017-03-16
RALPH LESLIE COHEN
Director 2011-03-18 2015-04-30
SWIFT INCORPORATIONS LIMITED
Nominated Secretary 1996-06-05 1996-06-24
INSTANT COMPANIES LIMITED
Nominated Director 1996-06-05 1996-06-24

Related Directorships

Officer Related Company Role Date Appointed Role StatusIncorporation dateCompany Status
DAVID ELIE CICUREL CRYSTALLON LIMITED Director 2017-07-17 CURRENT 2010-07-08 Active
DAVID ELIE CICUREL OXFORD CRYOSYSTEMS LIMITED Director 2017-07-17 CURRENT 1964-01-17 Active
DAVID ELIE CICUREL EWB SOLUTIONS LTD. Director 2016-11-28 CURRENT 1999-04-21 Active
DAVID ELIE CICUREL DIA-STRON LIMITED Director 2016-03-31 CURRENT 1987-11-23 Active
DAVID ELIE CICUREL COOLLED LIMITED Director 2016-02-17 CURRENT 2011-06-01 Active
DAVID ELIE CICUREL MARVIN'S MAGIC LIMITED Director 2015-09-21 CURRENT 1999-11-17 Active
DAVID ELIE CICUREL ARMFIELD TECHNICAL EDUCATION COMPANY LIMITED Director 2015-01-22 CURRENT 1980-10-22 Active
DAVID ELIE CICUREL ARMFIELD LIMITED Director 2015-01-22 CURRENT 1985-11-20 Active
DAVID ELIE CICUREL SCIENTIFICA LTD Director 2013-06-26 CURRENT 1996-12-02 Active
DAVID ELIE CICUREL GDS INSTRUMENTS LIMITED Director 2012-03-06 CURRENT 1982-06-25 Active
DAVID ELIE CICUREL GLOBAL DIGITAL SYSTEMS LIMITED Director 2012-03-06 CURRENT 1979-11-05 Active
DAVID ELIE CICUREL BORDEAUX ACQUISITION LIMITED Director 2011-03-18 CURRENT 2011-01-31 Active
DAVID ELIE CICUREL FTT SCIENTIFIC LIMITED Director 2010-12-23 CURRENT 2010-12-23 Active
DAVID ELIE CICUREL JAMES GALT & CO. LIMITED Director 2010-11-16 CURRENT 1914-04-28 Active
DAVID ELIE CICUREL GLOBAL BRAND INVESTMENTS LIMITED Director 2010-10-19 CURRENT 2010-10-19 Liquidation
DAVID ELIE CICUREL SIRCAL INSTRUMENTS (U.K.) LIMITED Director 2010-03-18 CURRENT 1981-10-19 Active
DAVID ELIE CICUREL POLARON INSTRUMENTS LIMITED Director 2009-09-11 CURRENT 2001-07-25 Active
DAVID ELIE CICUREL JUDGES CAPITAL LIMITED Director 2009-08-28 CURRENT 2009-08-28 Active
DAVID ELIE CICUREL EM TECHNOLOGIES LIMITED Director 2009-06-09 CURRENT 2005-01-25 Active
DAVID ELIE CICUREL QUORUM TECHNOLOGIES LIMITED Director 2009-06-09 CURRENT 2001-08-20 Active
DAVID ELIE CICUREL AITCHEE ENGINEERING LIMITED Director 2006-08-25 CURRENT 2006-07-20 Active
DAVID ELIE CICUREL STANTON REDCROFT LIMITED Director 2006-03-22 CURRENT 1997-12-08 Active
DAVID ELIE CICUREL UHV DESIGN LIMITED Director 2006-02-21 CURRENT 2000-12-29 Active
DAVID ELIE CICUREL PE. FIBEROPTICS LIMITED Director 2005-09-02 CURRENT 2005-08-02 Active
DAVID ELIE CICUREL FIRE TESTING TECHNOLOGY LIMITED Director 2005-05-24 CURRENT 1989-05-22 Active
DAVID ELIE CICUREL JUDGES SCIENTIFIC PLC Director 2002-12-04 CURRENT 2002-11-21 Active
GARY PAUL EDWARDS CRYSTALLON LIMITED Director 2017-07-17 CURRENT 2010-07-08 Active
GARY PAUL EDWARDS OXFORD CRYOSYSTEMS LIMITED Director 2017-07-17 CURRENT 1964-01-17 Active
GARY PAUL EDWARDS BORDEAUX ACQUISITION LIMITED Director 2011-03-18 CURRENT 2011-01-31 Active
MARK STEPHEN LAVELLE PE. FIBEROPTICS LIMITED Director 2018-02-28 CURRENT 2005-08-02 Active
MARK STEPHEN LAVELLE UHV DESIGN LIMITED Director 2017-11-15 CURRENT 2000-12-29 Active
MARK STEPHEN LAVELLE DIA-STRON LIMITED Director 2017-11-15 CURRENT 1987-11-23 Active
MARK STEPHEN LAVELLE FIRE TESTING TECHNOLOGY LIMITED Director 2017-11-15 CURRENT 1989-05-22 Active
MARK STEPHEN LAVELLE AITCHEE ENGINEERING LIMITED Director 2017-11-15 CURRENT 2006-07-20 Active
MARK STEPHEN LAVELLE SCIENTIFICA LTD Director 2017-11-15 CURRENT 1996-12-02 Active
MARK STEPHEN LAVELLE ARMFIELD LIMITED Director 2017-11-15 CURRENT 1985-11-20 Active
MARK STEPHEN LAVELLE EWB SOLUTIONS LTD. Director 2017-11-15 CURRENT 1999-04-21 Active
MARK STEPHEN LAVELLE QUORUM TECHNOLOGIES LIMITED Director 2017-11-15 CURRENT 2001-08-20 Active
MARK STEPHEN LAVELLE JUDGES SCIENTIFIC PLC Director 2017-11-15 CURRENT 2002-11-21 Active
MARK STEPHEN LAVELLE JUDGES CAPITAL LIMITED Director 2017-11-15 CURRENT 2009-08-28 Active
MARK STEPHEN LAVELLE CRYSTALLON LIMITED Director 2017-11-15 CURRENT 2010-07-08 Active
MARK STEPHEN LAVELLE BORDEAUX ACQUISITION LIMITED Director 2017-11-15 CURRENT 2011-01-31 Active
MARK STEPHEN LAVELLE COOLLED LIMITED Director 2017-11-15 CURRENT 2011-06-01 Active
MARK STEPHEN LAVELLE OXFORD CRYOSYSTEMS LIMITED Director 2017-11-15 CURRENT 1964-01-17 Active
MARK STEPHEN LAVELLE SIRCAL INSTRUMENTS (U.K.) LIMITED Director 2017-11-15 CURRENT 1981-10-19 Active
MARK STEPHEN LAVELLE GLOBAL DIGITAL SYSTEMS LIMITED Director 2017-11-15 CURRENT 1979-11-05 Active
BRADLEY LEONARD ORMSBY CRYSTALLON LIMITED Director 2017-07-17 CURRENT 2010-07-08 Active
BRADLEY LEONARD ORMSBY OXFORD CRYOSYSTEMS LIMITED Director 2017-07-17 CURRENT 1964-01-17 Active
BRADLEY LEONARD ORMSBY EWB SOLUTIONS LTD. Director 2016-11-28 CURRENT 1999-04-21 Active
BRADLEY LEONARD ORMSBY DIA-STRON LIMITED Director 2016-03-31 CURRENT 1987-11-23 Active
BRADLEY LEONARD ORMSBY COOLLED LIMITED Director 2016-02-17 CURRENT 2011-06-01 Active
BRADLEY LEONARD ORMSBY EM TECHNOLOGIES LIMITED Director 2015-04-30 CURRENT 2005-01-25 Active
BRADLEY LEONARD ORMSBY FTT SCIENTIFIC LIMITED Director 2015-04-30 CURRENT 2010-12-23 Active
BRADLEY LEONARD ORMSBY STANTON REDCROFT LIMITED Director 2015-04-30 CURRENT 1997-12-08 Active
BRADLEY LEONARD ORMSBY ARMFIELD TECHNICAL EDUCATION COMPANY LIMITED Director 2015-04-30 CURRENT 1980-10-22 Active
BRADLEY LEONARD ORMSBY ARMFIELD LIMITED Director 2015-04-30 CURRENT 1985-11-20 Active
BRADLEY LEONARD ORMSBY PE. FIBEROPTICS LIMITED Director 2015-04-30 CURRENT 2005-08-02 Active
BRADLEY LEONARD ORMSBY JUDGES CAPITAL LIMITED Director 2015-03-26 CURRENT 2009-08-28 Active
BRADLEY LEONARD ORMSBY BORDEAUX ACQUISITION LIMITED Director 2015-03-10 CURRENT 2011-01-31 Active
BRADLEY LEONARD ORMSBY UHV DESIGN LIMITED Director 2015-03-04 CURRENT 2000-12-29 Active
BRADLEY LEONARD ORMSBY GDS INSTRUMENTS LIMITED Director 2015-03-04 CURRENT 1982-06-25 Active
BRADLEY LEONARD ORMSBY QUORUM TECHNOLOGIES LIMITED Director 2015-03-04 CURRENT 2001-08-20 Active
BRADLEY LEONARD ORMSBY GLOBAL DIGITAL SYSTEMS LIMITED Director 2015-03-04 CURRENT 1979-11-05 Active
BRADLEY LEONARD ORMSBY FIRE TESTING TECHNOLOGY LIMITED Director 2015-03-03 CURRENT 1989-05-22 Active
BRADLEY LEONARD ORMSBY AITCHEE ENGINEERING LIMITED Director 2015-03-03 CURRENT 2006-07-20 Active
BRADLEY LEONARD ORMSBY JUDGES SCIENTIFIC PLC Director 2015-03-03 CURRENT 2002-11-21 Active
BRADLEY LEONARD ORMSBY SIRCAL INSTRUMENTS (U.K.) LIMITED Director 2015-03-03 CURRENT 1981-10-19 Active
BRADLEY LEONARD ORMSBY POLARON INSTRUMENTS LIMITED Director 2015-03-03 CURRENT 2001-07-25 Active
BRADLEY LEONARD ORMSBY SCIENTIFICA LTD Director 2015-02-25 CURRENT 1996-12-02 Active

More director information

Corporation Filing History
Companies House Filing History
This is a record of the public documents (corporate filing) lodged from Companies House where the company has filed annual returns and other statutory filing documents. Examples of documents filed include: change of registered office, accounts filing, director/officer appointments & resignations, changes in share capital, shareholder members lists etc.

DateDocument TypeDocument Description
2023-09-21SMALL COMPANY ACCOUNTS MADE UP TO 31/12/22
2023-08-10DIRECTOR APPOINTED MR JAMES FRANCIS SEAN BEW WATSON
2023-06-19CONFIRMATION STATEMENT MADE ON 05/06/23, WITH UPDATES
2023-03-10DIRECTOR APPOINTED DR TIM PRESTIDGE
2022-10-17RES01ADOPT ARTICLES 17/10/22
2022-10-17MEM/ARTSARTICLES OF ASSOCIATION
2022-10-12Statement of company's objects
2022-10-12CC04Statement of company's objects
2022-10-06CESSATION OF BORDEAUX ACQUISITION LIMITED AS A PERSON OF SIGNIFICANT CONTROL
2022-10-06Notification of Judges Scientific Plc as a person with significant control on 2022-09-29
2022-10-06PSC02Notification of Judges Scientific Plc as a person with significant control on 2022-09-29
2022-10-06PSC07CESSATION OF BORDEAUX ACQUISITION LIMITED AS A PERSON OF SIGNIFICANT CONTROL
2022-10-05REGISTRATION OF A CHARGE / CHARGE CODE 032082550010
2022-10-05MR01REGISTRATION OF A CHARGE / CHARGE CODE 032082550010
2022-09-26FULL ACCOUNTS MADE UP TO 31/12/21
2022-09-26AAFULL ACCOUNTS MADE UP TO 31/12/21
2022-06-20CONFIRMATION STATEMENT MADE ON 05/06/22, WITH NO UPDATES
2022-06-20CS01CONFIRMATION STATEMENT MADE ON 05/06/22, WITH NO UPDATES
2022-06-01MR04 STATEMENT OF SATISFACTION OF A CHARGE / FULL / CHARGE CODE 8
2021-09-29AP01DIRECTOR APPOINTED MR ANDREW JAMES PRIOR
2021-09-25AAFULL ACCOUNTS MADE UP TO 31/12/20
2021-06-14CS01CONFIRMATION STATEMENT MADE ON 05/06/21, WITH NO UPDATES
2020-09-30AAFULL ACCOUNTS MADE UP TO 31/12/19
2020-06-12CS01CONFIRMATION STATEMENT MADE ON 05/06/20, WITH NO UPDATES
2020-03-24TM01APPOINTMENT TERMINATED, DIRECTOR EDWARD JOHN WILLIAMSON-BROWN
2019-12-09MR01REGISTRATION OF A CHARGE / CHARGE CODE 032082550009
2019-09-25AAFULL ACCOUNTS MADE UP TO 31/12/18
2019-06-05CS01CONFIRMATION STATEMENT MADE ON 05/06/19, WITH NO UPDATES
2018-10-26AP03Appointment of Mr Glynn Carl Reece as company secretary on 2018-10-01
2018-10-26TM02Termination of appointment of Christopher Talbot on 2018-10-01
2018-09-25AAFULL ACCOUNTS MADE UP TO 31/12/17
2018-06-15CS01CONFIRMATION STATEMENT MADE ON 05/06/18, WITH NO UPDATES
2018-01-09TM01APPOINTMENT TERMINATED, DIRECTOR DAVID BARNBROOK
2017-12-04AP01DIRECTOR APPOINTED MR MARK STEPHEN LAVELLE
2017-09-30AAFULL ACCOUNTS MADE UP TO 31/12/16
2017-06-15LATEST SOC15/06/17 STATEMENT OF CAPITAL;GBP 2
2017-06-15CS01CONFIRMATION STATEMENT MADE ON 05/06/17, WITH UPDATES
2017-03-17TM01APPOINTMENT TERMINATED, DIRECTOR NICHOLAS JAMS BARTHEE
2017-03-17AP03Appointment of Mr Christopher Talbot as company secretary on 2017-03-16
2017-03-17TM02Termination of appointment of Tracey Edwards on 2017-03-16
2016-09-18AAFULL ACCOUNTS MADE UP TO 31/12/15
2016-06-07LATEST SOC07/06/16 STATEMENT OF CAPITAL;GBP 2
2016-06-07AR0105/06/16 ANNUAL RETURN FULL LIST
2015-11-02AD01REGISTERED OFFICE CHANGED ON 02/11/15 FROM Unit 19 Charlwoods Road East Grinstead West Sussex RH19 2HL
2015-09-22AAFULL ACCOUNTS MADE UP TO 31/12/14
2015-08-19AP01DIRECTOR APPOINTED MR EDWARD JOHN WILLIAMSON-BROWN
2015-06-09LATEST SOC09/06/15 STATEMENT OF CAPITAL;GBP 2
2015-06-09AR0105/06/15 ANNUAL RETURN FULL LIST
2015-06-09AP01DIRECTOR APPOINTED MR NICHOLAS JAMS BARTHEE
2015-06-09AP01DIRECTOR APPOINTED MR BRADLEY LEONARD ORMSBY
2015-06-09AP01DIRECTOR APPOINTED DR PAUL MICHAEL GADSBY
2015-06-09TM01APPOINTMENT TERMINATED, DIRECTOR RALPH LESLIE COHEN
2014-09-02AAFULL ACCOUNTS MADE UP TO 31/12/13
2014-06-10LATEST SOC10/06/14 STATEMENT OF CAPITAL;GBP 2
2014-06-10AR0105/06/14 ANNUAL RETURN FULL LIST
2014-06-10CH01DIRECTOR'S CHANGE OF PARTICULARS / MR GARY PAUL EDWARDS / 10/06/2014
2014-06-10CH01DIRECTOR'S CHANGE OF PARTICULARS / MR RALPH LESLIE COHEN / 10/06/2014
2014-06-10CH01DIRECTOR'S CHANGE OF PARTICULARS / MR DAVID ELIE CICUREL / 10/06/2014
2014-06-10CH01DIRECTOR'S CHANGE OF PARTICULARS / MR DAVID BARNBROOK / 10/06/2014
2014-06-10CH03SECRETARY'S CHANGE OF PARTICULARS / MRS TRACEY EDWARDS / 10/06/2014
2013-09-16AAFULL ACCOUNTS MADE UP TO 31/12/12
2013-06-20AR0105/06/13 FULL LIST
2012-09-14AAFULL ACCOUNTS MADE UP TO 31/12/11
2012-06-14AR0105/06/12 FULL LIST
2011-09-28AA01CURRSHO FROM 17/03/2012 TO 31/12/2011
2011-09-14AA17/03/11 TOTAL EXEMPTION SMALL
2011-07-21AA01PREVSHO FROM 18/03/2011 TO 17/03/2011
2011-06-14AR0105/06/11 FULL LIST
2011-04-15AA01PREVSHO FROM 31/10/2011 TO 18/03/2011
2011-04-15AD01REGISTERED OFFICE CHANGED ON 15/04/2011 FROM BRICKFIELDS BUSINESS PARK OLD STOWMARKET ROAD WOOLPIT BURY ST. EDMUNDS SUFFOLK IP30 9QS
2011-04-15AP01DIRECTOR APPOINTED MR DAVID ELIE CICUREL
2011-04-15AP01DIRECTOR APPOINTED MR RALPH LESLIE COHEN
2011-04-15AP01DIRECTOR APPOINTED MR DAVID BARNBROOK
2011-04-06ANNOTATIONClarification
2011-04-01MG01PARTICULARS OF A MORTGAGE OR CHARGE / CHARGE NO: 8
2011-03-26MG01PARTICULARS OF A MORTGAGE OR CHARGE / CHARGE NO: 7
2011-03-09MG02DECLARATION OF SATISFACTION IN FULL OR IN PART OF A MORTGAGE OR CHARGE /FULL /CHARGE NO 4
2011-03-09MG02DECLARATION OF SATISFACTION IN FULL OR IN PART OF A MORTGAGE OR CHARGE /FULL /CHARGE NO 6
2011-03-09MG02DECLARATION OF SATISFACTION IN FULL OR IN PART OF A MORTGAGE OR CHARGE /FULL /CHARGE NO 2
2011-03-09MG02DECLARATION OF SATISFACTION IN FULL OR IN PART OF A MORTGAGE OR CHARGE /FULL /CHARGE NO 5
2011-03-09MG02DECLARATION OF SATISFACTION IN FULL OR IN PART OF A MORTGAGE OR CHARGE /FULL /CHARGE NO 1
2011-03-09MG02DECLARATION OF SATISFACTION IN FULL OR IN PART OF A MORTGAGE OR CHARGE /FULL /CHARGE NO 3
2010-06-24AR0105/06/10 FULL LIST
2010-06-24CH01DIRECTOR'S CHANGE OF PARTICULARS / GARY PAUL EDWARDS / 05/06/2010
2010-04-14AA31/10/09 TOTAL EXEMPTION SMALL
2009-06-29363aRETURN MADE UP TO 05/06/09; FULL LIST OF MEMBERS
2009-04-15AA31/10/08 TOTAL EXEMPTION SMALL
2008-12-02288cSECRETARY'S CHANGE OF PARTICULARS / TRACEY EDWARDS / 01/12/2008
2008-12-01363aRETURN MADE UP TO 05/06/08; FULL LIST OF MEMBERS
2008-05-07AA31/10/07 TOTAL EXEMPTION SMALL
2007-08-28AATOTAL EXEMPTION SMALL ACCOUNTS MADE UP TO 31/10/06
2007-06-22363sRETURN MADE UP TO 05/06/07; NO CHANGE OF MEMBERS
2006-06-13363sRETURN MADE UP TO 05/06/06; FULL LIST OF MEMBERS
2006-05-19AATOTAL EXEMPTION SMALL ACCOUNTS MADE UP TO 31/10/05
2005-08-11AATOTAL EXEMPTION SMALL ACCOUNTS MADE UP TO 31/10/04
2005-07-15363(353)LOCATION OF REGISTER OF MEMBERS ADDRESS CHANGED
2005-07-15363sRETURN MADE UP TO 05/06/05; FULL LIST OF MEMBERS
2005-04-07395PARTICULARS OF MORTGAGE/CHARGE
2005-02-08287REGISTERED OFFICE CHANGED ON 08/02/05 FROM: SHEEPCOTE HALL STOWUPLAND STOWMARKET SUFFOLK IP14 5BS
2004-08-31AAFULL ACCOUNTS MADE UP TO 31/10/03
2004-07-17395PARTICULARS OF MORTGAGE/CHARGE
2004-07-17395PARTICULARS OF MORTGAGE/CHARGE
2004-07-01363sRETURN MADE UP TO 05/06/04; FULL LIST OF MEMBERS
2003-06-12363sRETURN MADE UP TO 05/06/03; FULL LIST OF MEMBERS
2003-05-21AAACCOUNTS FOR 'SMALL' CO. MADE UP TO 31/10/02
2003-04-06287REGISTERED OFFICE CHANGED ON 06/04/03 FROM: KNAPTON HOUSE 12 LOWER BROOK STREET IPSWICH SUFFOLK IP4 1AT
2002-09-11395PARTICULARS OF MORTGAGE/CHARGE
2002-09-11395PARTICULARS OF MORTGAGE/CHARGE
2002-07-12AATOTAL EXEMPTION SMALL ACCOUNTS MADE UP TO 31/10/01
2002-07-02363(353)LOCATION OF REGISTER OF MEMBERS ADDRESS CHANGED
2002-07-02363sRETURN MADE UP TO 05/06/02; FULL LIST OF MEMBERS
2001-06-19363sRETURN MADE UP TO 05/06/01; FULL LIST OF MEMBERS
2001-03-08AAFULL ACCOUNTS MADE UP TO 31/10/00
2000-06-29363(288)SECRETARY'S PARTICULARS CHANGED;DIRECTOR'S PARTICULARS CHANGED
2000-06-29363sRETURN MADE UP TO 05/06/00; FULL LIST OF MEMBERS
2000-06-23AAACCOUNTS FOR 'SMALL' CO. MADE UP TO 31/10/99
1999-06-22363sRETURN MADE UP TO 05/06/99; NO CHANGE OF MEMBERS
Industry Information
SIC/NAIC Codes
28 - Manufacture of machinery and equipment n.e.c.
289 - Manufacture of other special-purpose machinery
28990 - Manufacture of other special-purpose machinery n.e.c.




Licences & Regulatory approval
We could not find any licences issued to DEBEN UK LIMITED or authorisation from an industry specific regulator to operate. These may not be required.
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Risks
Legal Notices
No legal notices or events such as winding-up orders or proposals to strike-off have been issued
Fines / Sanctions
No fines or sanctions have been issued against DEBEN UK LIMITED
Liabilities
Mortgages / Charges
Total # Mortgages/Charges 10
Mortgages/Charges outstanding 2
Mortgages Partially Satisifed 0
Mortgages Satisfied/Paid 8
Details of Mortgagee Charges
Charge Type Date of Charge Charge Status Mortgagee
DEBENTURE 2011-04-01 Outstanding BANK OF SCOTLAND PLC
LEGAL CHARGE 2011-03-26 Outstanding BANK OF SCOTLAND PLC
LEGAL MORTGAGE 2005-04-06 Satisfied HSBC BANK PLC
LEGAL CHARGE 2004-06-28 Satisfied GARY PAUL EDWARDS AND TRACEY EDWARDS
LEGAL CHARGE 2004-06-28 Satisfied DEBEN RESEARCH LIMITED
LEGAL MORTGAGE 2002-09-10 Satisfied HSBC BANK PLC
LEGAL MORTGAGE 2002-09-10 Satisfied HSBC BANK PLC
FIXED AND FLOATING CHARGE 1996-11-06 Satisfied MIDLAND BANK PLC
Filed Financial Reports
Annual Accounts
2013-12-31
Annual Accounts
2012-12-31
Annual Accounts
2011-12-31
Annual Accounts
2011-03-17

These are the financial reports (either an abhreviated set of accounts or profit& loss statement and balance sheet) have been filed with Companies House. The reports allow you to do a basic business credit check on DEBEN UK LIMITED

Intangible Assets
Patents
We have not found any records of DEBEN UK LIMITED registering or being granted any patents
Domain Names

DEBEN UK LIMITED owns 1 domain names.

deben.co.uk  

Trademarks
We have not found any records of DEBEN UK LIMITED registering or being granted any trademarks
Income
Government Income
We have not found government income sources for DEBEN UK LIMITED. This could be because the transaction value was below £ 500 with local government or below £ 25,000 for central government. We have found 8,000 supplier to government that are UK companies so approx 0.2% of companies listed on Datalog supply to government.

The top companies supplying to UK government with the same SIC code (28990 - Manufacture of other special-purpose machinery n.e.c.) as DEBEN UK LIMITED are:

Outgoings
Business Rates/Property Tax
No properties were found where DEBEN UK LIMITED is liable for the business rates / property tax. This could be for a number of reasons.
  • The council hasnt published the data
  • We havent found or been able to process the councils data
  • The company is part of a group of companies and another company in the group is liable for business rates
  • The registered office may be a residential address which does not have a commercial designation. If the business is run from home then it won't be a commercial property and hence won't be liable for business rates.
  • Serviced offices are increasingly popular and therefore a business may not be paying business rates directly - the building owner is and this is incorporated in the office rental charge.
Import/Export of Goods
Goods imported/exported by DEBEN UK LIMITED
OriginDestinationDateImport CodeImported Goods classification description
2018-12-0090121010Electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
2018-12-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-12-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-12-0090241020
2018-12-0090241080
2018-12-0084129080Parts of non-electrical engines and motors, n.e.s.
2018-12-0084129080Parts of non-electrical engines and motors, n.e.s.
2018-12-0085012000Universal AC-DC motors of an output > 37,5 W
2018-12-0085012000Universal AC-DC motors of an output > 37,5 W
2018-12-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2018-12-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2018-11-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-11-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-11-0090269000Parts and accessories for instruments and apparatus for measuring or checking the flow, level, pressure or other variables of liquids or gases, n.e.s.
2018-11-0090269000Parts and accessories for instruments and apparatus for measuring or checking the flow, level, pressure or other variables of liquids or gases, n.e.s.
2018-10-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-10-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-10-0090241020
2018-10-0085016180AC generators "alternators", of an output > 7,5 kVA but <= 75 kVA
2018-10-0085016180AC generators "alternators", of an output > 7,5 kVA but <= 75 kVA
2018-09-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-09-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-09-0038220000Diagnostic or laboratory reagents on a backing, prepared diagnostic or laboratory reagents whether or not on a backing, and certified reference materials (excl. compound diagnostic reagents designed to be administered to the patient, blood-grouping reagents, animal blood prepared for therapeutic, prophylactic or diagnostic uses and vaccines, toxins, cultures of micro-organisms and similar products)
2018-09-0038220000Diagnostic or laboratory reagents on a backing, prepared diagnostic or laboratory reagents whether or not on a backing, and certified reference materials (excl. compound diagnostic reagents designed to be administered to the patient, blood-grouping reagents, animal blood prepared for therapeutic, prophylactic or diagnostic uses and vaccines, toxins, cultures of micro-organisms and similar products)
2018-09-0084799070
2018-09-0084799070
2018-08-0090121010Electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles
2018-08-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-08-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-07-0084661020Arbors, collets and sleeves for use as tool holders in machine tools, incl. tool holders for any type of tool for working in the hand
2018-07-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-07-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-07-0090301000Instruments and apparatus for measuring or detecting ionising radiations
2018-07-0085013300DC motors and DC generators of an output > 75 kW but <= 375 kW
2018-07-0085013300DC motors and DC generators of an output > 75 kW but <= 375 kW
2018-07-0090314990Optical instruments, appliances and machines for measuring or checking, not elsewhere specified or included in chapter 90
2018-07-0090314990Optical instruments, appliances and machines for measuring or checking, not elsewhere specified or included in chapter 90
2018-06-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-06-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-06-0090301000Instruments and apparatus for measuring or detecting ionising radiations
2018-05-0085234130Optical discs for laser reading systems, unrecorded, of a recording capacity > 900 megabytes but <= 18 gigabytes, non-erasable "DVD-/+Rs"
2018-05-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-05-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-05-0090241020
2018-05-0090248090Machines and appliances for testing the mechanical properties of materials, non-electronic (excl. metals)
2018-04-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-04-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-04-0090241020
2018-04-0084122989Hydraulic power engines and motors (excl. linear acting [cylinders], hydraulic systems, hydraulic fluid power motors, hydraulic turbines and water wheels of heading 8410 and steam turbines)
2018-04-0084122989Hydraulic power engines and motors (excl. linear acting [cylinders], hydraulic systems, hydraulic fluid power motors, hydraulic turbines and water wheels of heading 8410 and steam turbines)
2018-03-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-03-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-03-0090241020
2018-03-0085340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2018-03-0085340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2018-03-0090121090Electron microscopes, proton microscopes and diffraction apparatus (excl. electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-03-0090121090Electron microscopes, proton microscopes and diffraction apparatus (excl. electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-02-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-02-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-02-0090241020
2018-02-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2018-02-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2018-01-0090121090Electron microscopes, proton microscopes and diffraction apparatus (excl. electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-01-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2018-01-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2018-01-0090241020
2018-01-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2018-01-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2017-04-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2017-04-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2017-04-0090241020
2017-04-0090241040
2017-03-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2017-03-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2017-03-0090241020
2017-02-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2017-02-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2017-02-0090241020
2017-01-0085439000Parts of electrical machines and apparatus, having individual functions, n.e.s. in chapter 85
2017-01-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2017-01-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2017-01-0090189010Instruments and apparatus for measuring blood-pressure
2016-11-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-11-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-11-0090241011Electronic machines and appliances for universal testing of mechanical properties of metals or for tensile testing of metals
2016-11-0090311000Machines for balancing mechanical parts
2016-11-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2016-10-0087089997Parts and accessories for tractors, motor vehicles for the transport of ten or more persons, motor cars and other motor vehicles principally designed for the transport of persons, motor vehicles for the transport of goods and special purpose motor vehicles, n.e.s. (excl. of closed-die forged steel)
2016-10-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-10-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-10-0090241011Electronic machines and appliances for universal testing of mechanical properties of metals or for tensile testing of metals
2016-09-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-09-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-09-0085011099DC motors of an output <= 37,5 W
2016-08-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-08-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-07-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-07-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-07-0090229000X-ray generators other than X-ray tubes, high tension generators, control panels and desks, screens, examination or treatment tables, chairs and the like, and general parts and accessories for apparatus of heading 9022, n.e.s.
2016-07-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2016-07-0090328900Regulating or controlling instruments and apparatus (excl. hydraulic or pneumatic, manostats, thermostats, and taps, cocks and valves of heading 8481)
2016-06-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-06-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-05-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-05-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-04-0087084050Gear boxes for tractors, motor vehicles for the transport of ten or more persons, motor cars and other motor vehicles principally designed for the transport of persons, motor vehicles for the transport of goods and special purpose motor vehicles (excl. those for the industrial assembly of certain motor vehicles of subheading 8708.40.20)
2016-04-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-04-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-04-0090314990Optical instruments, appliances and machines for measuring or checking, not elsewhere specified or included in chapter 90
2016-03-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-03-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-03-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2016-02-0090121090Electron microscopes, proton microscopes and diffraction apparatus (excl. electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-02-0090129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2016-02-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2016-02-0084313900Parts of machinery of heading 8428, n.e.s.
2016-02-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2016-01-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-12-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-11-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-11-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2015-10-0090029000Lenses, prisms, mirrors and other optical elements, mounted, of any material, being parts of or fittings for instruments or apparatus (excl. objective lenses for cameras, projectors or photographic enlargers or reducers, such elements of glass not optically worked, and filters)
2015-10-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-09-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-08-0085366910Plugs and sockets for a voltage of <= 1.000 V, for coaxial cables
2015-08-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-08-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2015-06-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-06-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-05-0185258019Television cameras (excl. those with 3 or more camera tubes and video recorders)
2015-05-0085258019Television cameras (excl. those with 3 or more camera tubes and video recorders)
2015-04-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-04-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-03-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-03-0090129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2015-01-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2015-01-0090279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2014-12-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-12-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2014-11-0190129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2014-11-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-10-0190121090Electron microscopes, proton microscopes and diffraction apparatus (excl. electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-10-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-10-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2014-09-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-08-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-06-0190029000Lenses, prisms, mirrors and other optical elements, mounted, of any material, being parts of or fittings for instruments or apparatus (excl. objective lenses for cameras, projectors or photographic enlargers or reducers, such elements of glass not optically worked, and filters)
2014-06-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2014-04-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-03-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-03-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2014-02-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-01-0185184080Audio-frequency electric amplifiers (excl. telephonic or measurement amplifiers)
2014-01-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2014-01-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2013-11-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-11-0190314990Optical instruments, appliances and machines for measuring or checking, not elsewhere specified or included in chapter 90
2013-10-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-10-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2013-09-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-09-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2013-09-0190299000Parts and accessories for revolution counters, production counters, taximeters, milometers, pedometers and the like, speed indicators and tachometers, and stroboscopes, n.e.s.
2013-08-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-08-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2013-07-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-07-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2013-06-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-06-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2013-05-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-04-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-03-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-03-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2013-02-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-02-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2013-01-0190019000Lenses, prisms, mirrors and other optical elements, of any material, unmounted (excl. such elements of glass not optically worked, contact lenses and spectacle lenses)
2013-01-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2013-01-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2012-11-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-11-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2012-11-0190309085Parts and accessories for instruments and apparatus for measuring or checking electrical quantities or for detecting ionising radiations, n.e.s. (excl. for instruments and apparatus for measuring or checking semiconductor wafers or devices)
2012-10-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-09-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-09-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2012-08-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-08-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2012-07-0185015399AC motors, multi-phase, of an output > 750 kW (excl. traction motors)
2012-07-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-07-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2012-06-0139269097Articles of plastics and articles of other materials of heading 3901 to 3914, n.e.s.
2012-06-0190121090Electron microscopes, proton microscopes and diffraction apparatus (excl. electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-06-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-06-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2012-05-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2012-04-0190129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.
2012-04-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-03-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-03-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2012-02-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2012-01-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-12-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-12-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2011-11-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-11-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2011-10-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-10-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2011-09-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-09-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2011-08-0184669300
2011-08-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-07-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2011-06-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-06-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2011-05-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-05-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2011-04-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-04-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2011-03-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-03-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2011-02-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-01-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2011-01-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-12-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-12-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-11-0184879090Machinery parts of chapter 84, not intended for a specific purpose, n.e.s.
2010-11-0187089997Parts and accessories for tractors, motor vehicles for the transport of ten or more persons, motor cars and other motor vehicles principally designed for the transport of persons, motor vehicles for the transport of goods and special purpose motor vehicles, n.e.s. (excl. of closed-die forged steel)
2010-11-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-11-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-10-0184128080Engines and motors, non-electrical (excl. steam turbines, internal combustion piston engine, hydraulic turbines, water wheels, gas turbines, reaction engines, hydraulic power engines and motors, pneumatic power engines and motors, steam or other vapour power engines and electric motors)
2010-10-0187089997Parts and accessories for tractors, motor vehicles for the transport of ten or more persons, motor cars and other motor vehicles principally designed for the transport of persons, motor vehicles for the transport of goods and special purpose motor vehicles, n.e.s. (excl. of closed-die forged steel)
2010-10-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-10-0190330000Parts and accessories for machines, appliances, instruments or other apparatus in chapter 90, specified neither in this chapter nor elsewhere
2010-09-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-09-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-08-0184119100Parts of turbojets or turbopropellers, n.e.s.
2010-08-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-08-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-07-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-07-0190269000Parts and accessories for instruments and apparatus for measuring or checking the flow, level, pressure or other variables of liquids or gases, n.e.s.
2010-07-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-06-0130029090Toxins and similar products, e.g. plasmodia (excl. vaccines and cultures of micro-organisms)
2010-06-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-05-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-05-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2010-04-0187089997Parts and accessories for tractors, motor vehicles for the transport of ten or more persons, motor cars and other motor vehicles principally designed for the transport of persons, motor vehicles for the transport of goods and special purpose motor vehicles, n.e.s. (excl. of closed-die forged steel)
2010-04-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-04-0190189085
2010-04-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-03-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-03-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-02-0185016400AC generators "alternators", of an output > 750 kVA
2010-02-0187089997Parts and accessories for tractors, motor vehicles for the transport of ten or more persons, motor cars and other motor vehicles principally designed for the transport of persons, motor vehicles for the transport of goods and special purpose motor vehicles, n.e.s. (excl. of closed-die forged steel)
2010-02-0190129090Parts and accessories for electron microscopes, proton microscopes and diffraction apparatus, n.e.s. (excl. of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles)
2010-02-0190279050Parts and accessories of instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, of instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like and of instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters, n.e.s. (excl. of gas or smoke analysis apparatus)
2010-01-0184799080Parts of machines and mechanical appliances having individual functions, n.e.s. (excl. of cast iron or cast steel)
2010-01-0185016400AC generators "alternators", of an output > 750 kVA
2010-01-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2010-01-0190129010Parts and accessories of electron microscopes fitted with equipment specifically designed for the handling and transport of semiconductor wafers or reticles, n.e.s.

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Government Grants / Awards
Technology Strategy Board Awards
The Technology Strategy Board has not awarded DEBEN UK LIMITED any grants or awards. Grants from the TSB are an indicator that the company is investing in new technologies or IPR
European Union CORDIS Awards
The European Union has not awarded DEBEN UK LIMITED any grants or awards.
Ownership
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