Active
Company Information for PROBE TEST SOLUTIONS LIMITED
KINTAIL HOUSE 3 LISTER WAY, HAMILTON INTERNATIONAL TECHNOLOGY PARK, GLASGOW, G72 0FT,
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Company Registration Number
![]() Private Limited Company
Active |
Company Name | |
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PROBE TEST SOLUTIONS LIMITED | |
Legal Registered Office | |
KINTAIL HOUSE 3 LISTER WAY HAMILTON INTERNATIONAL TECHNOLOGY PARK GLASGOW G72 0FT Other companies in ML4 | |
Company Number | SC361790 | |
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Company ID Number | SC361790 | |
Date formed | 2009-06-26 | |
Country | SCOTLAND | |
Origin Country | United Kingdom | |
Type | Private Limited Company | |
CompanyStatus | Active | |
Lastest accounts | 31/12/2023 | |
Account next due | 30/09/2025 | |
Latest return | 26/06/2016 | |
Return next due | 24/07/2017 | |
Type of accounts | FULL | |
VAT Number /Sales tax ID |
Last Datalog update: | 2024-11-05 10:53:40 |
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Officer | Role | Date Appointed |
---|---|---|
SHONA STIRLING |
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JORDAN MACKELLAR |
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GORDON STIRLING |
Officer | Related Company | Role | Date Appointed | Role Status | Incorporation date | Company Status |
---|---|---|---|---|---|---|
HOPE CONNECTIONS | Director | 2015-03-31 | CURRENT | 1999-04-08 | Active | |
PROBE TEST RESEARCH LIMITED | Director | 2011-11-30 | CURRENT | 2011-11-30 | Active | |
PROBE TEST GROUP LIMITED | Director | 2011-11-30 | CURRENT | 2011-11-30 | Active |
Date | Document Type | Document Description |
---|---|---|
FULL ACCOUNTS MADE UP TO 31/12/23 | ||
CONFIRMATION STATEMENT MADE ON 26/06/24, WITH NO UPDATES | ||
REGISTERED OFFICE CHANGED ON 05/03/24 FROM Argyle Crescent Hillhouse Industrial Estate Hamilton Lanarkshire ML3 9BQ Scotland | ||
Director's details changed for Mr Jordan Mackellar on 2024-03-05 | ||
SECRETARY'S DETAILS CHNAGED FOR FIONA MACKINNON on 2024-03-05 | ||
Change of details for Probe Test Group Ltd as a person with significant control on 2024-03-05 | ||
FULL ACCOUNTS MADE UP TO 31/12/22 | ||
REGISTRATION OF A CHARGE / CHARGE CODE SC3617900004 | ||
CONFIRMATION STATEMENT MADE ON 26/06/23, WITH UPDATES | ||
REGISTRATION OF A CHARGE / CHARGE CODE SC3617900003 | ||
APPOINTMENT TERMINATED, DIRECTOR LAURA ANN MACKELLAR | ||
APPOINTMENT TERMINATED, DIRECTOR JORDAN MICHAEL MACKELLAR | ||
Current accounting period extended from 25/12/22 TO 31/12/22 | ||
AA | SMALL COMPANY ACCOUNTS MADE UP TO 25/12/21 | |
CS01 | CONFIRMATION STATEMENT MADE ON 26/06/22, WITH NO UPDATES | |
AP03 | Appointment of Fiona Mackinnon as company secretary on 2022-06-24 | |
CH01 | Director's details changed for Mr Jordan Mackellar on 2022-05-10 | |
AD01 | REGISTERED OFFICE CHANGED ON 10/05/22 FROM Argyle Crescent Hillhouse Industrial Estate Hamilton Lanarkshire ML3 9QB Scotland | |
AA | 25/12/20 ACCOUNTS TOTAL EXEMPTION FULL | |
AP01 | DIRECTOR APPOINTED MRS LAURA ANN MACKELLAR | |
CS01 | CONFIRMATION STATEMENT MADE ON 26/06/21, WITH UPDATES | |
AA | 25/12/19 ACCOUNTS TOTAL EXEMPTION FULL | |
AA | 25/12/19 ACCOUNTS TOTAL EXEMPTION FULL | |
CS01 | CONFIRMATION STATEMENT MADE ON 26/06/20, WITH UPDATES | |
TM02 | Termination of appointment of Shona Stirling on 2019-04-09 | |
TM01 | APPOINTMENT TERMINATED, DIRECTOR GORDON STIRLING | |
AA | 25/12/18 ACCOUNTS TOTAL EXEMPTION FULL | |
CS01 | CONFIRMATION STATEMENT MADE ON 26/06/19, WITH UPDATES | |
CH01 | Director's details changed for Mr Jordan Mackellar on 2016-12-06 | |
AA | 25/12/17 ACCOUNTS TOTAL EXEMPTION FULL | |
CS01 | CONFIRMATION STATEMENT MADE ON 26/06/18, WITH UPDATES | |
AA | 25/12/16 ACCOUNTS TOTAL EXEMPTION FULL | |
PSC02 | Notification of Probe Test Group Ltd as a person with significant control on 2016-04-06 | |
LATEST SOC | 18/07/17 STATEMENT OF CAPITAL;GBP 2 | |
CS01 | CONFIRMATION STATEMENT MADE ON 26/06/17, WITH UPDATES | |
MR04 | STATEMENT OF SATISFACTION OF A CHARGE / FULL / CHARGE CODE SC3617900002 | |
MR04 | STATEMENT OF SATISFACTION OF A CHARGE / FULL / CHARGE CODE SC3617900001 | |
AA | 25/12/15 ACCOUNTS TOTAL EXEMPTION SMALL | |
LATEST SOC | 18/07/16 STATEMENT OF CAPITAL;GBP 2 | |
AR01 | 26/06/16 ANNUAL RETURN FULL LIST | |
CH03 | SECRETARY'S DETAILS CHNAGED FOR MRS SHONA STIRLING on 2016-04-11 | |
CH01 | Director's details changed for Mr Gordon Stirling on 2016-04-11 | |
AD01 | REGISTERED OFFICE CHANGED ON 14/07/16 FROM 1 Argyle Crescent Hillhouse Industrial Estate Hamilton Lanarkshire ML3 9BQ Scotland | |
MR01 | REGISTRATION OF A CHARGE / CHARGE CODE SC3617900002 | |
MR01 | REGISTRATION OF A CHARGE / CHARGE CODE SC3617900001 | |
AD01 | REGISTERED OFFICE CHANGED ON 14/03/16 FROM Unit L Belgrave Central Cubitt Court Bellshill Industrial Estate Bellshill Lanarkshire ML4 3PS | |
AA | 25/12/14 ACCOUNTS TOTAL EXEMPTION SMALL | |
LATEST SOC | 24/07/15 STATEMENT OF CAPITAL;GBP 2 | |
AR01 | 26/06/15 ANNUAL RETURN FULL LIST | |
LATEST SOC | 11/07/14 STATEMENT OF CAPITAL;GBP 2 | |
AR01 | 26/06/14 ANNUAL RETURN FULL LIST | |
AA | 25/12/13 ACCOUNTS TOTAL EXEMPTION SMALL | |
CH01 | Director's details changed for Gordon Stirling on 2012-02-20 | |
AR01 | 26/06/13 ANNUAL RETURN FULL LIST | |
CH01 | Director's details changed for Mr Jordan Mackellar on 2012-02-20 | |
AA | 25/12/12 TOTAL EXEMPTION SMALL | |
AR01 | 26/06/12 FULL LIST | |
AA | 25/12/11 TOTAL EXEMPTION SMALL | |
AD01 | REGISTERED OFFICE CHANGED ON 29/02/2012 FROM EVANS BUSINESS CENTRE BELGRAVE STREET BELLSHILL INDUSTRIAL ESTATE BELLSHILL LANARKSHIRE ML4 3NP SCOTLAND | |
AR01 | 26/06/11 FULL LIST | |
AA | 25/12/10 TOTAL EXEMPTION SMALL | |
AA01 | PREVEXT FROM 30/06/2010 TO 25/12/2010 | |
AR01 | 26/06/10 FULL LIST | |
CH01 | DIRECTOR'S CHANGE OF PARTICULARS / GORDON STIRLING / 26/06/2010 | |
CH03 | SECRETARY'S CHANGE OF PARTICULARS / SHONA STIRLING / 26/06/2010 | |
AD01 | REGISTERED OFFICE CHANGED ON 08/07/2010 FROM 18 QUARRY ROAD LAW SOUTH LANARKSHIRE ML8 5HB SCOTLAND | |
AP01 | DIRECTOR APPOINTED MR JORDAN MACKELLAR | |
88(2) | AD 01/07/09 GBP SI 1@1=1 GBP IC 1/2 | |
NEWINC | INCORPORATION DOCUMENTS CERTIFICATE OF INCORPORATION STATEMENT OF DIRECTORS & REGISTERED OFFICE DECLARATION OF COMPLIANCE MEMORANDUM OF ASSOCIATION ARTICLES OF ASSOCIATION |
Total # Mortgages/Charges | 4 |
---|---|
Mortgages/Charges outstanding | 2 |
Mortgages Partially Satisifed | 0 |
Mortgages Satisfied/Paid | 2 |
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These are the financial reports (either an abhreviated set of accounts or profit& loss statement and balance sheet) have been filed with Companies House. The reports allow you to do a basic business credit check on PROBE TEST SOLUTIONS LIMITED
The top companies supplying to UK government with the same SIC code (71122 - Engineering related scientific and technical consulting activities) as PROBE TEST SOLUTIONS LIMITED are:
Origin | Destination | Date | Import Code | Imported Goods classification description |
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![]() | 84869090 | Parts and accessories for machines and apparatus of a kind used solely or principally for the manufacture of semiconductor boules or wafers, semiconductor devices, electronic integrated circuits or flat panel displays, and for machines and apparatus specified in note 9 C to chapter 84, n.e.s. (excl. tool holders, self-opening dieheads, workholders, those of spinners for coating photographic emulsions, for physical deposition by sputtering, for dry-etching patterns, for chemical vapour depositio | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 85423300 | Electronic integrated circuits as amplifiers | ||
![]() | 85423990 | Electronic integrated circuits (excl. in the form of multichip integrated circuits and such as processors, controllers, memories and amplifiers) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90309085 | Parts and accessories for instruments and apparatus for measuring or checking electrical quantities or for detecting ionising radiations, n.e.s. (excl. for instruments and apparatus for measuring or checking semiconductor wafers or devices) | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 85369085 | Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 85235191 | Solid-state, non-volatile data storage devices for recording data from an external source [flash memory cards or flash electronic storage cards], recorded, for reproducing phenomena (excl. those for reproducing sound or image, for reproducing representations of instructions, data, sound, and image recorded in a machine-readable binary form, and capable of being manipulated or providing interactivity to a user, by means of an automatic data-processing machine, and goods of chapter 37) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90319085 | Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s. | ||
![]() | 72299090 | Wire of alloy steel other than stainless, in coils (excl. rolled bars and rods, wire of high-speed steel or silico-manganese steel and articles of subheading 7229.90.50) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 85369085 | Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90318098 | Non-electronic and non-optical instruments, apparatus and machines for measuring or checking, n.e.s. in chapter 90 | ||
![]() | 85340019 | Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 85369085 | Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers) | ||
![]() | 90279080 | Parts and accessories of microtomes or of gas or smoke analysis apparatus, n.e.s. | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 84869090 | Parts and accessories for machines and apparatus of a kind used solely or principally for the manufacture of semiconductor boules or wafers, semiconductor devices, electronic integrated circuits or flat panel displays, and for machines and apparatus specified in note 9 C to chapter 84, n.e.s. (excl. tool holders, self-opening dieheads, workholders, those of spinners for coating photographic emulsions, for physical deposition by sputtering, for dry-etching patterns, for chemical vapour depositio | ||
![]() | 85340019 | Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 39269097 | Articles of plastics and articles of other materials of heading 3901 to 3914, n.e.s. | ||
![]() | 84869090 | Parts and accessories for machines and apparatus of a kind used solely or principally for the manufacture of semiconductor boules or wafers, semiconductor devices, electronic integrated circuits or flat panel displays, and for machines and apparatus specified in note 9 C to chapter 84, n.e.s. (excl. tool holders, self-opening dieheads, workholders, those of spinners for coating photographic emulsions, for physical deposition by sputtering, for dry-etching patterns, for chemical vapour depositio | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 85369085 | Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers) | ||
![]() | 85371099 | Boards, cabinets and similar combinations of apparatus for electric control or the distribution of electricity, for a voltage <= 1.000 V (excl. switching apparatus for line telephony or line telegraphy, numerical control panels with built-in automatic data-processing machines and programmable memory controllers) | ||
![]() | 85423990 | Electronic integrated circuits (excl. in the form of multichip integrated circuits and such as processors, controllers, memories and amplifiers) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 85059090 | Parts of permanent magnets, electromagnets, electromagnetic clutches, couplings, brakes and lifting heads, electromagnetic or permanent magnet holding devices, n.e.s. | ||
![]() | 85235999 | Semiconductor media, recorded, for reproducing sound or image (excl. for reproducing representations of instructions, data, sound, and image recorded in a machine-readable binary form, and capable of being manipulated or providing interactivity to a user, by means of an automatic data-processing machine, solid-state non-volatile data storage devices, smart cards, and goods of chapter 37) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 85340019 | Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits) | ||
![]() | 85369085 | Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90309020 | Parts and accessories for instruments and apparatus for measuring or checking semiconductor wafers or devices, n.e.s. | ||
![]() | 84733080 | Parts and accessories of automatic data-processing machines or for other machines of heading 8471, n.e.s. (excl. electronic assemblies) | ||
![]() | 85238099 | Media, recorded, for reproducing sound or image, incl. matrices and masters for the production of discs (excl. for reproducing representations of instructions, data, sound, and image recorded in a machine-readable binary form, and capable of being manipulated or providing interactivity to a user, by means of an automatic data-processing machine, magnetic, optical and semiconductor media, and products of chapter 37) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85429000 | Parts of electronic integrated circuits, n.e.s. | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 85369020 | Wafer probers | ||
![]() | 85369085 | Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 40169100 | Floor coverings and mats, of vulcanised rubber (excl. hard rubber), with chamfered sides, rounded corners or shaped edges or otherwise worked (excl. those simply cut to rectangular or square shape and goods of cellular rubber) | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85369085 | Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 85444999 | Electric conductors for a voltage 1.000 V, insulated, not fitted with connectors, n.e.s. (excl. winding wire, coaxial conductors, wiring sets for vehicles, aircraft or ships, and wire and cables with individual conductor wires of a diameter > 0,51 mm) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90318032 | Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 90319030 | Parts and accessories for electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.s. | ||
![]() | 72299090 | Wire of alloy steel other than stainless, in coils (excl. rolled bars and rods, wire of high-speed steel or silico-manganese steel and articles of subheading 7229.90.50) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 85366930 | Plugs and sockets for a voltage of <= 1.000 V, for printed circuits | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90318098 | Non-electronic and non-optical instruments, apparatus and machines for measuring or checking, n.e.s. in chapter 90 | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 84669400 | Parts and accessories for machine tools for working metal without removing material, n.e.s. | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 90319085 | Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s. | ||
![]() | 73182900 | Non-threaded articles, of iron or steel | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 90319085 | Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s. | ||
![]() | 73269098 | Articles of iron or steel, n.e.s. | ||
![]() | 76149000 | Stranded wires, cables, ropes and similar articles, of aluminium (other than with steel core and electrically insulated products) | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90249000 | Parts and accessories for machines and appliances for testing the mechanical properties of materials, n.e.s. | ||
![]() | 90318032 | Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340019 | Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90318032 | Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 90319030 | Parts and accessories for electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.s. | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90318032 | Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 90319085 | Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s. | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85340019 | Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits) | ||
![]() | 90318032 | Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340019 | Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85340019 | Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits) | ||
![]() | 85340090 | Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements) | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 85340019 | Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits) | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 90311000 | Machines for balancing mechanical parts | ||
![]() | 84862090 | Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes) | ||
![]() | 85340011 | Multilayer printed circuits, consisting only of conductor elements and contacts | ||
![]() | 85447000 | Optical fibre cables made up of individually sheathed fibres, whether or not containing electric conductors or fitted with connectors | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90308200 | Instruments and apparatus for measuring or checking semiconductor wafers or devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 90118000 | Optical microscopes (excl. for photomicrography, cinephotomicrography or microprojection, stereoscopic microscopes, binocular microscopes for ophthalmology and instruments, appliances and machines of heading 9031) | ||
![]() | 90314100 | Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices | ||
![]() | 90319020 | Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. | ||
![]() | 73199090 | Knitting needles, bodkins, crochet hooks, embroidery stilettos and similar articles, of iron or steel (excl. sewing, darning or embroidery needles) | ||
![]() | 90309085 | Parts and accessories for instruments and apparatus for measuring or checking electrical quantities or for detecting ionising radiations, n.e.s. (excl. for instruments and apparatus for measuring or checking semiconductor wafers or devices) | ||
![]() | 84861000 | Machines and apparatus for the manufacture of boules or wafers |
For goods imported into the United Kingdom, only imports originating from outside the EU are shown
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