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Company Information for

PROBE TEST SOLUTIONS LIMITED

KINTAIL HOUSE 3 LISTER WAY, HAMILTON INTERNATIONAL TECHNOLOGY PARK, GLASGOW, G72 0FT,
Company Registration Number
SC361790
Private Limited Company
Active

Company Overview

About Probe Test Solutions Ltd
PROBE TEST SOLUTIONS LIMITED was founded on 2009-06-26 and has its registered office in Glasgow. The organisation's status is listed as "Active". Probe Test Solutions Limited is a Private Limited Company registered in SCOTLAND with Companies House and the accounts submission requirement is categorised as FULL
  • Annual turnover is £6.5 million or more
  • The balance sheet total is £ 3.26 million or more
  • Employs 50 or more employees
  • May be publically listed
  • May be a member of a group of companies meeting any of the above criteria
Key Data
Company Name
PROBE TEST SOLUTIONS LIMITED
 
Legal Registered Office
KINTAIL HOUSE 3 LISTER WAY
HAMILTON INTERNATIONAL TECHNOLOGY PARK
GLASGOW
G72 0FT
Other companies in ML4
 
Filing Information
Company Number SC361790
Company ID Number SC361790
Date formed 2009-06-26
Country SCOTLAND
Origin Country United Kingdom
Type Private Limited Company
CompanyStatus Active
Lastest accounts 31/12/2023
Account next due 30/09/2025
Latest return 26/06/2016
Return next due 24/07/2017
Type of accounts FULL
VAT Number /Sales tax ID GB984870169  GB423481020  
Last Datalog update: 2024-11-05 10:53:40
Primary Source:Companies House
There are multiple companies registered at this address, the registered address may be the accountant's offices for PROBE TEST SOLUTIONS LIMITED
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Company Officers of PROBE TEST SOLUTIONS LIMITED

Current Directors
Officer Role Date Appointed
SHONA STIRLING
Company Secretary 2009-06-26
JORDAN MACKELLAR
Director 2010-03-05
GORDON STIRLING
Director 2009-06-26

Related Directorships

Officer Related Company Role Date Appointed Role StatusIncorporation dateCompany Status
GORDON STIRLING HOPE CONNECTIONS Director 2015-03-31 CURRENT 1999-04-08 Active
GORDON STIRLING PROBE TEST RESEARCH LIMITED Director 2011-11-30 CURRENT 2011-11-30 Active
GORDON STIRLING PROBE TEST GROUP LIMITED Director 2011-11-30 CURRENT 2011-11-30 Active

More director information

Corporation Filing History
Companies House Filing History
This is a record of the public documents (corporate filing) lodged from Companies House where the company has filed annual returns and other statutory filing documents. Examples of documents filed include: change of registered office, accounts filing, director/officer appointments & resignations, changes in share capital, shareholder members lists etc.

DateDocument TypeDocument Description
2024-09-27FULL ACCOUNTS MADE UP TO 31/12/23
2024-06-26CONFIRMATION STATEMENT MADE ON 26/06/24, WITH NO UPDATES
2024-03-05REGISTERED OFFICE CHANGED ON 05/03/24 FROM Argyle Crescent Hillhouse Industrial Estate Hamilton Lanarkshire ML3 9BQ Scotland
2024-03-05Director's details changed for Mr Jordan Mackellar on 2024-03-05
2024-03-05SECRETARY'S DETAILS CHNAGED FOR FIONA MACKINNON on 2024-03-05
2024-03-05Change of details for Probe Test Group Ltd as a person with significant control on 2024-03-05
2023-10-03FULL ACCOUNTS MADE UP TO 31/12/22
2023-08-26REGISTRATION OF A CHARGE / CHARGE CODE SC3617900004
2023-06-26CONFIRMATION STATEMENT MADE ON 26/06/23, WITH UPDATES
2023-06-16REGISTRATION OF A CHARGE / CHARGE CODE SC3617900003
2023-02-20APPOINTMENT TERMINATED, DIRECTOR LAURA ANN MACKELLAR
2023-02-20APPOINTMENT TERMINATED, DIRECTOR JORDAN MICHAEL MACKELLAR
2022-11-07Current accounting period extended from 25/12/22 TO 31/12/22
2022-08-17AASMALL COMPANY ACCOUNTS MADE UP TO 25/12/21
2022-06-28CS01CONFIRMATION STATEMENT MADE ON 26/06/22, WITH NO UPDATES
2022-06-24AP03Appointment of Fiona Mackinnon as company secretary on 2022-06-24
2022-05-10CH01Director's details changed for Mr Jordan Mackellar on 2022-05-10
2022-05-10AD01REGISTERED OFFICE CHANGED ON 10/05/22 FROM Argyle Crescent Hillhouse Industrial Estate Hamilton Lanarkshire ML3 9QB Scotland
2021-09-15AA25/12/20 ACCOUNTS TOTAL EXEMPTION FULL
2021-08-31AP01DIRECTOR APPOINTED MRS LAURA ANN MACKELLAR
2021-07-04CS01CONFIRMATION STATEMENT MADE ON 26/06/21, WITH UPDATES
2020-09-23AA25/12/19 ACCOUNTS TOTAL EXEMPTION FULL
2020-09-23AA25/12/19 ACCOUNTS TOTAL EXEMPTION FULL
2020-07-01CS01CONFIRMATION STATEMENT MADE ON 26/06/20, WITH UPDATES
2020-06-30TM02Termination of appointment of Shona Stirling on 2019-04-09
2020-06-30TM01APPOINTMENT TERMINATED, DIRECTOR GORDON STIRLING
2019-09-25AA25/12/18 ACCOUNTS TOTAL EXEMPTION FULL
2019-06-26CS01CONFIRMATION STATEMENT MADE ON 26/06/19, WITH UPDATES
2019-05-02CH01Director's details changed for Mr Jordan Mackellar on 2016-12-06
2018-09-20AA25/12/17 ACCOUNTS TOTAL EXEMPTION FULL
2018-06-27CS01CONFIRMATION STATEMENT MADE ON 26/06/18, WITH UPDATES
2017-09-07AA25/12/16 ACCOUNTS TOTAL EXEMPTION FULL
2017-07-18PSC02Notification of Probe Test Group Ltd as a person with significant control on 2016-04-06
2017-07-18LATEST SOC18/07/17 STATEMENT OF CAPITAL;GBP 2
2017-07-18CS01CONFIRMATION STATEMENT MADE ON 26/06/17, WITH UPDATES
2017-03-03MR04STATEMENT OF SATISFACTION OF A CHARGE / FULL / CHARGE CODE SC3617900002
2017-03-03MR04STATEMENT OF SATISFACTION OF A CHARGE / FULL / CHARGE CODE SC3617900001
2016-09-09AA25/12/15 ACCOUNTS TOTAL EXEMPTION SMALL
2016-07-18LATEST SOC18/07/16 STATEMENT OF CAPITAL;GBP 2
2016-07-18AR0126/06/16 ANNUAL RETURN FULL LIST
2016-07-14CH03SECRETARY'S DETAILS CHNAGED FOR MRS SHONA STIRLING on 2016-04-11
2016-07-14CH01Director's details changed for Mr Gordon Stirling on 2016-04-11
2016-07-14AD01REGISTERED OFFICE CHANGED ON 14/07/16 FROM 1 Argyle Crescent Hillhouse Industrial Estate Hamilton Lanarkshire ML3 9BQ Scotland
2016-06-02MR01REGISTRATION OF A CHARGE / CHARGE CODE SC3617900002
2016-06-02MR01REGISTRATION OF A CHARGE / CHARGE CODE SC3617900001
2016-03-14AD01REGISTERED OFFICE CHANGED ON 14/03/16 FROM Unit L Belgrave Central Cubitt Court Bellshill Industrial Estate Bellshill Lanarkshire ML4 3PS
2015-09-18AA25/12/14 ACCOUNTS TOTAL EXEMPTION SMALL
2015-07-24LATEST SOC24/07/15 STATEMENT OF CAPITAL;GBP 2
2015-07-24AR0126/06/15 ANNUAL RETURN FULL LIST
2014-07-11LATEST SOC11/07/14 STATEMENT OF CAPITAL;GBP 2
2014-07-11AR0126/06/14 ANNUAL RETURN FULL LIST
2014-04-25AA25/12/13 ACCOUNTS TOTAL EXEMPTION SMALL
2013-07-17CH01Director's details changed for Gordon Stirling on 2012-02-20
2013-07-16AR0126/06/13 ANNUAL RETURN FULL LIST
2013-07-16CH01Director's details changed for Mr Jordan Mackellar on 2012-02-20
2013-04-30AA25/12/12 TOTAL EXEMPTION SMALL
2012-07-19AR0126/06/12 FULL LIST
2012-05-11AA25/12/11 TOTAL EXEMPTION SMALL
2012-02-29AD01REGISTERED OFFICE CHANGED ON 29/02/2012 FROM EVANS BUSINESS CENTRE BELGRAVE STREET BELLSHILL INDUSTRIAL ESTATE BELLSHILL LANARKSHIRE ML4 3NP SCOTLAND
2011-08-10AR0126/06/11 FULL LIST
2011-03-16AA25/12/10 TOTAL EXEMPTION SMALL
2010-12-31AA01PREVEXT FROM 30/06/2010 TO 25/12/2010
2010-07-08AR0126/06/10 FULL LIST
2010-07-08CH01DIRECTOR'S CHANGE OF PARTICULARS / GORDON STIRLING / 26/06/2010
2010-07-08CH03SECRETARY'S CHANGE OF PARTICULARS / SHONA STIRLING / 26/06/2010
2010-07-08AD01REGISTERED OFFICE CHANGED ON 08/07/2010 FROM 18 QUARRY ROAD LAW SOUTH LANARKSHIRE ML8 5HB SCOTLAND
2010-06-01AP01DIRECTOR APPOINTED MR JORDAN MACKELLAR
2009-11-1288(2)AD 01/07/09 GBP SI 1@1=1 GBP IC 1/2
2009-06-26NEWINCINCORPORATION DOCUMENTS CERTIFICATE OF INCORPORATION STATEMENT OF DIRECTORS & REGISTERED OFFICE DECLARATION OF COMPLIANCE MEMORANDUM OF ASSOCIATION ARTICLES OF ASSOCIATION
Industry Information
SIC/NAIC Codes
71 - Architectural and engineering activities; technical testing and analysis
711 - Architectural and engineering activities and related technical consultancy
71122 - Engineering related scientific and technical consulting activities




Licences & Regulatory approval
We could not find any licences issued to PROBE TEST SOLUTIONS LIMITED or authorisation from an industry specific regulator to operate. These may not be required.
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Risks
Legal Notices
No legal notices or events such as winding-up orders or proposals to strike-off have been issued
Fines / Sanctions
No fines or sanctions have been issued against PROBE TEST SOLUTIONS LIMITED
Liabilities
Mortgages / Charges
Total # Mortgages/Charges 4
Mortgages/Charges outstanding 2
Mortgages Partially Satisifed 0
Mortgages Satisfied/Paid 2
Details of Mortgagee Charges
We do not yet have the details of PROBE TEST SOLUTIONS LIMITED's previous or outstanding mortgage charges.
Filed Financial Reports
Annual Accounts
2014-12-25
Annual Accounts
2017-12-25
Annual Accounts
2018-12-25
Annual Accounts
2019-12-25
Annual Accounts
2020-12-25

These are the financial reports (either an abhreviated set of accounts or profit& loss statement and balance sheet) have been filed with Companies House. The reports allow you to do a basic business credit check on PROBE TEST SOLUTIONS LIMITED

Intangible Assets
Patents
We have not found any records of PROBE TEST SOLUTIONS LIMITED registering or being granted any patents
Domain Names
We do not have the domain name information for PROBE TEST SOLUTIONS LIMITED
Trademarks
We have not found any records of PROBE TEST SOLUTIONS LIMITED registering or being granted any trademarks
Income
Government Income
We have not found government income sources for PROBE TEST SOLUTIONS LIMITED. This could be because the transaction value was below £ 500 with local government or below £ 25,000 for central government. We have found 8,000 supplier to government that are UK companies so approx 0.2% of companies listed on Datalog supply to government.

The top companies supplying to UK government with the same SIC code (71122 - Engineering related scientific and technical consulting activities) as PROBE TEST SOLUTIONS LIMITED are:

AECOM LIMITED £ 213,848
COOPER AND WITHYCOMBE LIMITED £ 132,631
ENITIAL LIMITED £ 42,162
TERRACONSULT LIMITED £ 37,085
WARNER LAND SURVEYS LIMITED £ 30,150
THE CONCRETE AND CORROSION CONSULTANCY PRACTICE LIMITED £ 28,490
CURTINS CONSULTING LIMITED £ 27,596
ALAN CONISBEE AND ASSOCIATES LIMITED £ 23,348
WSP UK LIMITED £ 21,800
MURPHY GEOSPATIAL UK LTD £ 19,317
QINETIQ LIMITED £ 74,519,394
AECOM LIMITED £ 43,275,811
WSP UK LIMITED £ 33,926,074
AMEY OW LIMITED £ 19,127,218
WILDE CONSULTANTS LIMITED £ 5,537,105
OVE ARUP & PARTNERS INTERNATIONAL LIMITED £ 4,913,895
RAMBOLL UK LIMITED £ 3,021,946
PELL FRISCHMANN LIMITED £ 1,562,194
JEREMY BENN ASSOCIATES LIMITED £ 1,332,498
ENITIAL LIMITED £ 1,187,662
QINETIQ LIMITED £ 74,519,394
AECOM LIMITED £ 43,275,811
WSP UK LIMITED £ 33,926,074
AMEY OW LIMITED £ 19,127,218
WILDE CONSULTANTS LIMITED £ 5,537,105
OVE ARUP & PARTNERS INTERNATIONAL LIMITED £ 4,913,895
RAMBOLL UK LIMITED £ 3,021,946
PELL FRISCHMANN LIMITED £ 1,562,194
JEREMY BENN ASSOCIATES LIMITED £ 1,332,498
ENITIAL LIMITED £ 1,187,662
QINETIQ LIMITED £ 74,519,394
AECOM LIMITED £ 43,275,811
WSP UK LIMITED £ 33,926,074
AMEY OW LIMITED £ 19,127,218
WILDE CONSULTANTS LIMITED £ 5,537,105
OVE ARUP & PARTNERS INTERNATIONAL LIMITED £ 4,913,895
RAMBOLL UK LIMITED £ 3,021,946
PELL FRISCHMANN LIMITED £ 1,562,194
JEREMY BENN ASSOCIATES LIMITED £ 1,332,498
ENITIAL LIMITED £ 1,187,662
Outgoings
Business Rates/Property Tax
No properties were found where PROBE TEST SOLUTIONS LIMITED is liable for the business rates / property tax. This could be for a number of reasons.
  • The council hasnt published the data
  • We havent found or been able to process the councils data
  • The company is part of a group of companies and another company in the group is liable for business rates
  • The registered office may be a residential address which does not have a commercial designation. If the business is run from home then it won't be a commercial property and hence won't be liable for business rates.
  • Serviced offices are increasingly popular and therefore a business may not be paying business rates directly - the building owner is and this is incorporated in the office rental charge.
Import/Export of Goods
Goods imported/exported by PROBE TEST SOLUTIONS LIMITED
OriginDestinationDateImport CodeImported Goods classification description
2015-07-0184869090Parts and accessories for machines and apparatus of a kind used solely or principally for the manufacture of semiconductor boules or wafers, semiconductor devices, electronic integrated circuits or flat panel displays, and for machines and apparatus specified in note 9 C to chapter 84, n.e.s. (excl. tool holders, self-opening dieheads, workholders, those of spinners for coating photographic emulsions, for physical deposition by sputtering, for dry-etching patterns, for chemical vapour depositio
2015-07-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2015-07-0185423300Electronic integrated circuits as amplifiers
2015-07-0185423990Electronic integrated circuits (excl. in the form of multichip integrated circuits and such as processors, controllers, memories and amplifiers)
2015-07-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2015-07-0190309085Parts and accessories for instruments and apparatus for measuring or checking electrical quantities or for detecting ionising radiations, n.e.s. (excl. for instruments and apparatus for measuring or checking semiconductor wafers or devices)
2015-07-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2015-06-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2015-06-0185369085Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers)
2015-06-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2015-06-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2015-05-0185235191Solid-state, non-volatile data storage devices for recording data from an external source [flash memory cards or flash electronic storage cards], recorded, for reproducing phenomena (excl. those for reproducing sound or image, for reproducing representations of instructions, data, sound, and image recorded in a machine-readable binary form, and capable of being manipulated or providing interactivity to a user, by means of an automatic data-processing machine, and goods of chapter 37)
2015-05-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2015-05-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2015-05-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2015-05-0190319085Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s.
2015-04-0172299090Wire of alloy steel other than stainless, in coils (excl. rolled bars and rods, wire of high-speed steel or silico-manganese steel and articles of subheading 7229.90.50)
2015-04-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2015-04-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2015-04-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2015-03-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2015-03-0185369085Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers)
2015-03-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2015-03-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2015-03-0190318098Non-electronic and non-optical instruments, apparatus and machines for measuring or checking, n.e.s. in chapter 90
2015-02-0185340019Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits)
2015-02-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2015-02-0185369085Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers)
2015-02-0190279080Parts and accessories of microtomes or of gas or smoke analysis apparatus, n.e.s.
2015-02-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2015-02-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2015-02-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2015-01-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2015-01-0184869090Parts and accessories for machines and apparatus of a kind used solely or principally for the manufacture of semiconductor boules or wafers, semiconductor devices, electronic integrated circuits or flat panel displays, and for machines and apparatus specified in note 9 C to chapter 84, n.e.s. (excl. tool holders, self-opening dieheads, workholders, those of spinners for coating photographic emulsions, for physical deposition by sputtering, for dry-etching patterns, for chemical vapour depositio
2015-01-0185340019Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits)
2015-01-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2015-01-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2015-01-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2014-12-0139269097Articles of plastics and articles of other materials of heading 3901 to 3914, n.e.s.
2014-12-0184869090Parts and accessories for machines and apparatus of a kind used solely or principally for the manufacture of semiconductor boules or wafers, semiconductor devices, electronic integrated circuits or flat panel displays, and for machines and apparatus specified in note 9 C to chapter 84, n.e.s. (excl. tool holders, self-opening dieheads, workholders, those of spinners for coating photographic emulsions, for physical deposition by sputtering, for dry-etching patterns, for chemical vapour depositio
2014-12-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2014-12-0185369085Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers)
2014-12-0185371099Boards, cabinets and similar combinations of apparatus for electric control or the distribution of electricity, for a voltage <= 1.000 V (excl. switching apparatus for line telephony or line telegraphy, numerical control panels with built-in automatic data-processing machines and programmable memory controllers)
2014-12-0185423990Electronic integrated circuits (excl. in the form of multichip integrated circuits and such as processors, controllers, memories and amplifiers)
2014-12-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-12-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2014-11-0185059090Parts of permanent magnets, electromagnets, electromagnetic clutches, couplings, brakes and lifting heads, electromagnetic or permanent magnet holding devices, n.e.s.
2014-11-0185235999Semiconductor media, recorded, for reproducing sound or image (excl. for reproducing representations of instructions, data, sound, and image recorded in a machine-readable binary form, and capable of being manipulated or providing interactivity to a user, by means of an automatic data-processing machine, solid-state non-volatile data storage devices, smart cards, and goods of chapter 37)
2014-11-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2014-11-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-11-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2014-10-0185340019Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits)
2014-10-0185369085Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers)
2014-10-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-10-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2014-09-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2014-09-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2014-09-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-09-0190309020Parts and accessories for instruments and apparatus for measuring or checking semiconductor wafers or devices, n.e.s.
2014-08-0184733080Parts and accessories of automatic data-processing machines or for other machines of heading 8471, n.e.s. (excl. electronic assemblies)
2014-08-0185238099Media, recorded, for reproducing sound or image, incl. matrices and masters for the production of discs (excl. for reproducing representations of instructions, data, sound, and image recorded in a machine-readable binary form, and capable of being manipulated or providing interactivity to a user, by means of an automatic data-processing machine, magnetic, optical and semiconductor media, and products of chapter 37)
2014-08-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2014-08-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-08-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2014-06-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2014-06-0185429000Parts of electronic integrated circuits, n.e.s.
2014-06-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-04-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2014-04-0185369020Wafer probers
2014-04-0185369085Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers)
2014-04-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-03-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2014-03-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-02-0140169100Floor coverings and mats, of vulcanised rubber (excl. hard rubber), with chamfered sides, rounded corners or shaped edges or otherwise worked (excl. those simply cut to rectangular or square shape and goods of cellular rubber)
2014-02-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2014-02-0185369085Electrical apparatus for making connections to or in electrical circuits, for a voltage <= 1.000 V (excl. fuses, circuit breakers and other apparatus for protecting electrical circuits, relays and other switches, lamp holders, plugs and sockets, prefabricated elements for electrical circuits and other connections and contact elements for wire and cables and for wafer probers)
2014-02-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-02-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2014-01-0185444999Electric conductors for a voltage 1.000 V, insulated, not fitted with connectors, n.e.s. (excl. winding wire, coaxial conductors, wiring sets for vehicles, aircraft or ships, and wire and cables with individual conductor wires of a diameter > 0,51 mm)
2014-01-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2014-01-0190318032Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2014-01-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2013-12-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2013-12-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2013-12-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2013-12-0190319030Parts and accessories for electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.s.
2013-11-0172299090Wire of alloy steel other than stainless, in coils (excl. rolled bars and rods, wire of high-speed steel or silico-manganese steel and articles of subheading 7229.90.50)
2013-11-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2013-11-0185366930Plugs and sockets for a voltage of <= 1.000 V, for printed circuits
2013-11-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2013-10-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2013-10-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2013-10-0190318098Non-electronic and non-optical instruments, apparatus and machines for measuring or checking, n.e.s. in chapter 90
2013-09-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2013-09-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2013-08-0184669400Parts and accessories for machine tools for working metal without removing material, n.e.s.
2013-08-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2013-08-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2013-08-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2013-08-0190319085Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s.
2013-07-0173182900Non-threaded articles, of iron or steel
2013-07-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2013-07-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2013-07-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2013-07-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2013-07-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2013-07-0190319085Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s.
2013-06-0173269098Articles of iron or steel, n.e.s.
2013-06-0176149000Stranded wires, cables, ropes and similar articles, of aluminium (other than with steel core and electrically insulated products)
2013-06-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2013-06-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2013-06-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2013-05-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2013-05-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2013-05-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2013-05-0190249000Parts and accessories for machines and appliances for testing the mechanical properties of materials, n.e.s.
2013-05-0190318032Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2013-04-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2013-04-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2013-03-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2013-03-0185340019Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits)
2013-03-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2013-03-0190318032Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2013-03-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2013-02-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2013-02-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2013-02-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2013-02-0190319030Parts and accessories for electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices, n.e.s.
2013-01-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2013-01-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2012-12-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2012-12-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2012-12-0190318032Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2012-12-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2012-12-0190319085Parts and accessories for instruments, appliances and machines for measuring and checking, n.e.s.
2012-11-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2012-10-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2012-09-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2012-09-0185340019Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits)
2012-09-0190318032Electronic instruments, apparatus and machines for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2012-09-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2012-08-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2012-08-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2012-08-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2012-07-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2012-07-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2012-06-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2012-06-0185340019Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits)
2012-06-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2012-06-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2012-05-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2012-05-0185340019Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits)
2012-04-0185340090Printed circuits consisting of conductor elements, contacts and other passive elements (excl. those with passive and active elements)
2012-04-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2012-03-0185340019Printed circuits consisting only of conductor elements and contacts (excl. multiple printed circuits)
2012-03-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2012-02-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2012-02-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2011-12-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2011-12-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2011-09-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2011-08-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2011-08-0190311000Machines for balancing mechanical parts
2011-07-0184862090Machines and apparatus for the manufacture of semiconductor devices or of electronic integrated circuits (excl. machine tools for working any material by removal of material operated by ultrasonic processes)
2011-07-0185340011Multilayer printed circuits, consisting only of conductor elements and contacts
2011-06-0185447000Optical fibre cables made up of individually sheathed fibres, whether or not containing electric conductors or fitted with connectors
2011-06-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2011-05-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2011-05-0190308200Instruments and apparatus for measuring or checking semiconductor wafers or devices
2011-05-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2011-04-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2011-04-0190118000Optical microscopes (excl. for photomicrography, cinephotomicrography or microprojection, stereoscopic microscopes, binocular microscopes for ophthalmology and instruments, appliances and machines of heading 9031)
2011-03-0190314100Optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices
2011-03-0190319020Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.
2010-10-0173199090Knitting needles, bodkins, crochet hooks, embroidery stilettos and similar articles, of iron or steel (excl. sewing, darning or embroidery needles)
2010-10-0190309085Parts and accessories for instruments and apparatus for measuring or checking electrical quantities or for detecting ionising radiations, n.e.s. (excl. for instruments and apparatus for measuring or checking semiconductor wafers or devices)
2010-06-0184861000Machines and apparatus for the manufacture of boules or wafers

For goods imported into the United Kingdom, only imports originating from outside the EU are shown

Government Grants / Awards
Technology Strategy Board Awards
The Technology Strategy Board has not awarded PROBE TEST SOLUTIONS LIMITED any grants or awards. Grants from the TSB are an indicator that the company is investing in new technologies or IPR
European Union CORDIS Awards
The European Union has not awarded PROBE TEST SOLUTIONS LIMITED any grants or awards.
Ownership
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